Determination of Elemental Impurities in U308 by Wavelength-dispersive X-ray Fluorescence Spectrometry

Ten UsOs reference materials certified for impurities were used to develop the analytical procedure. A sequential wavelength dispersive X-ray spectrometer was used to perform the measurements. The measurement conditions were optimized to assure the best signal to background ratios and the minimum spectral interferences. Nineteen elements (Al, Bi, Ca, Co, Cr, Cu, Fe, Mg, Mn, MO, Na, Ni, Pb, Si, Ti, V, W, Zn, Zr) can be determined above the 10 to 20 ppm level in a measurement time equal to 150 s for single element (50 s line intensity and 2 x 50 s background). The precision and accuracy is assessed based on the counting statistics and the confidence limits of the certified element concentrations.